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Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology

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https://hal.archives-ouvertes.fr/hal-03407794
Contributor : Chhandak Mukherjee Connect in order to contact the contributor
Submitted on : Friday, October 29, 2021 - 6:06:46 PM
Last modification on : Tuesday, November 16, 2021 - 12:02:13 PM

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  • HAL Id : hal-03407794, version 1

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Mukherjee Chhandak, Marine Couret, Cristell Maneux, Didier Céli. Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. 51th European Solid-State Device Research Conference, ESSDERC, Sep 2021, Virtual, France. ⟨hal-03407794⟩

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